Neural Comp. NEW Faster Access
HOME HELP FEEDBACK SUBSCRIPTIONS ARCHIVE SEARCH TABLE OF CONTENTS
 QUICK SEARCH:   [advanced]


     


This Article
Right arrow Full Text
Right arrow Full Text (PDF)
Right arrow Alert me when this article is cited
Right arrow Alert me if a correction is posted
Services
Right arrow Similar articles in this journal
Right arrow Alert me to new issues of the journal
Right arrow Download to citation manager
Right arrow reprints & permissions
Google Scholar
Right arrow Articles by Xia, Y.
Right arrow Articles by Ye, D.
PubMed
Right arrow Articles by Xia, Y.
Right arrow Articles by Ye, D.
(Neural Computation. 2008;20:2227-2237.)
© 2008 The MIT Press


Note

On Exponential Convergence Conditions of an Extended Projection Neural Network

Youshen Xia

ysxia2001{at}yahoo.com College of Mathematics and Computer Science, Fuzhou University, Fuzhou 350108, China

Dongyi Ye

yiedy{at}fzu.edu.cn College of Mathematics and Computer Science, Fuzhou University, Fuzhou 350108, China

Recently the extended projection neural network was proposed to solve constrained monotone variational inequality problems and a class of constrained nonmonotontic variational inequality problems. Its exponential convergence was developed under the positive definiteness condition of the Jacobian matrix of the nonlinear mapping. This note proposes new results on the exponential convergence of the output trajectory of the extended projection neural network under the weak conditions that the Jacobian matrix of the nonlinear mapping may be positive semidefinite or not. Therefore, new results further demonstrate that the extended projection neural network has a fast convergence rate when solving a class of constrained monotone variational inequality problems and nonmonotonic variational inequality problems. Illustrative examples show the significance of the obtained results.







HOME HELP FEEDBACK SUBSCRIPTIONS ARCHIVE SEARCH TABLE OF CONTENTS
J COGNITIVE NEUROSCIENCE NEURAL COMPUTATION MIT PRESS JOURNALS
Copyright © 2008 by The MIT Press.